대면적 글라스 및 필름 스테이지용 면저항측정기
| Measuring method | 4-Point Probe |
|---|---|
| Configuration | Sngle or dual |
| Measuring Range | 1mΩ/sq. ~ 1GΩ/sq. , 10.0 μΩ·㎝ ~ 10.0 MΩ·㎝ |
| Measurement accuracy | ±0.5% (KRISS Standard wafer, when 23℃) |
| Measuring time | range search max. 3s / search after actual 1-2s |
| 4-Point Probe pin spacing | 1.00㎜ |
| Pin load | 80~160g/pin |
| Pin radius | 300㎛ |
| Tolerance | ±0.01㎜ |
| Pin material | tngsten |